Nano Schottky Junction and Photoelectric Effect: Modeling and Characterization

الموضوعات

علوم تطبيقية وتكنولوجية

الملخص

Nano metal-semiconductor (M–S) Schottky contacts show a non-conventional behavior compared to the planar–Schottky contacts. The nano Schottky contact effect is inferred from the enhanced tunneling current in (I-V) curves at reversed biases, which has been observed experimentally in previous work . This enhancement of the tunneling current is attributed to the narrow depletion width and the enhanced electric field at the contact interface. In this work, we show that such nano Schottky junctions are sensitive to Electromagnetic waves (EM), especially in visible and infrared regimes. The incident EM waves on the nano M-S junction is partially absorbed and results in the high energy of the free electrons in the metal. This, in turn, increases the probability of electrons to tunnel through nano metal-semiconductor junction. We have incorporated this photo effect in a previous model of nano metal-semiconductor interfaces to investigate the change in the I-V behavior. The model considers different EM energies that can be captured by the excited electrons to calculate a new reduced barrier height, and hence on the tunneling current. Moreover, the model is examined using a conductive Atomic Force Microscope with a metal-coated nanotip, where the I-V data is generated and compared with a simulation model.

روابط وملفات

التعريف والنوع

رقم الوثيقة

ff295f8c-56ca-4ebe-97c7-ec5ddd20c81f

رقم العقد

0

نوع الوسائط

Crawler

نوع المحتوى

الرسائل العلمية

صيغة المصدر

رسائل ماجيستير

نوع الملف

pdf text

أسماء الملفات

2283200_1.pdf

بيانات النشر

ألقاب المؤلفين

[{"name_ar":" Hassan Barada","title_ar":"اشراف","title_en":"Supervision"},{"name_ar":"Fatmah Alkindi","title_ar":"اعداد","title_en":"Preparation"},{"name_ar":"Moh’d Rezeq","title_ar":"اشراف","title_en":"Supervision"}]

اللغة

English

المصدر والدورية

اسم المصدر

Nano Schottky Junction and Photoelectric Effect: Modeling and Characterization

المحتوى والصفحات

عدد الصفحات

0

كلمات الباحثين

Photoelectric effect, nano electrical characterization, nano Schottky, nanoprobes, conductive Atomic Force Microscope

إشراف وإعداد

الإشراف

Hassan Barada, Moh’d Rezeq

الإعداد

Fatmah Alkindi

الاقتباسات الببليوغرافية